Issued Patents 2025
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12340495 | Method for computational metrology and inspection for patterns to be manufactured on a substrate | Linyong Pang, Jocelyn Blair | 2025-06-24 |
| 12287567 | Method and system for reticle enhancement technology | Akira Fujimura, Nagesh Shirali | 2025-04-29 |
| 12288022 | Methods and systems for generating shape data for electronic designs | Suhas Pillai, Thang Nguyen | 2025-04-29 |