Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12362139 | Semiconductor inspection apparatus and semiconductor inspection method using the same | Yujin Cho, Jonghyuk Kang, INHYE PARK, Suyoung Lee, Hongche Noh +1 more | 2025-07-15 |
| 12352808 | Substrate inspection apparatus and substrate inspection method | Sekye Jeon, Jinwoo Lee, Jongcheon Sun, Suyoung Lee, Hyeongcheol Lee | 2025-07-08 |