Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12362139 | Semiconductor inspection apparatus and semiconductor inspection method using the same | Yujin Cho, INHYE PARK, Suyoung Lee, Chungsam Jun, Hongche Noh +1 more | 2025-07-15 |