Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12188883 | X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrate | Chun-Ting Liu, Wei-En Fu, Wen-Li Wu | 2025-01-07 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12188883 | X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrate | Chun-Ting Liu, Wei-En Fu, Wen-Li Wu | 2025-01-07 |