JB

Jiri Benda

FE Fei: 1 patents #16 of 78Top 25%
📍 Brno, CZ: #13 of 80 inventorsTop 20%
Overall (2025): #346,021 of 469,880Top 75%
1
Patents 2025

Issued Patents 2025

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
12431322 System and method for handling samples for study in a charged particle apparatus, such as a transmission electron microscope Vojtěch Doležal, Tomas Trnkocy, Jaroslav Hadzima, Martin Čechmánek, Ondrej Shanel 2025-09-30