Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12431322 | System and method for handling samples for study in a charged particle apparatus, such as a transmission electron microscope | Jiri Benda, Tomas Trnkocy, Jaroslav Hadzima, Martin Čechmánek, Ondrej Shanel | 2025-09-30 |