TW

Tianping Wang

GS Gowin Semiconductor: 1 patents #3 of 11Top 30%
Overall (2025): #80,282 of 469,880Top 20%
2
Patents 2025

Issued Patents 2025

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
12388466 Method and apparatus for testing error correcting code (ECC) function of FPGA on-chip block random access memory (BRAM) Jingxiang Wang, Yue Han, Zheng Wang, Yunjie Fan, Niu Li +1 more 2025-08-12
12340938 110 kV three-phase dry-type transformer and assembly method therefor Qinggan Zeng, Qi Chen, Guowei Zhou, Chenming Shi 2025-06-24