Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12388466 | Method and apparatus for testing error correcting code (ECC) function of FPGA on-chip block random access memory (BRAM) | Yue Han, Zheng Wang, Yunjie Fan, Tianping Wang, Niu Li +1 more | 2025-08-12 |