Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12222656 | Method for determining aberration sensitivity of patterns | Jingjing Liu, Duan-Fu Stephen Hsu | 2025-02-11 |
| 12210291 | Aberration impact systems, models, and manufacturing processes | Zhan Shi, Duan-Fu Stephen Hsu, Rafael C. Howell, Gerui LIU | 2025-01-28 |