Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12379655 | Contaminant identification metrology system, lithographic apparatus, and methods thereof | Ravi Chaitanya Kalluri, Michal Emanuel Pawlowski, James H. Walsh, Justin Kreuzer | 2025-08-05 |