Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12271116 | Method of measuring mask overlay using test patterns | Tseng Chin Lo, Bo-Sen Chang, Yueh-Yi Chen, Chih-Ting Sun, Ying-Jung Chen +1 more | 2025-04-08 |
| 12230645 | Stretchable pixel array substrate | Yun-Wen Pan | 2025-02-18 |