Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12271116 | Method of measuring mask overlay using test patterns | Tseng Chin Lo, Bo-Sen Chang, Yueh-Yi Chen, Chih-Ting Sun, Kung-Cheng Lin +1 more | 2025-04-08 |
YC
Ying-Jung Chen
Overall (2025): #164,320 of 469,880Top 35%
1
Patents 2025