Issued Patents 2024
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12163899 | System for optical inspection of a substrate using same or different wavelengths | Guillaume Vienne, Kaiss Benhadjsalem | 2024-12-10 |
| 12074400 | Substrate dimension adapter | Yueh Sheng Ow, Christophe Isnard | 2024-08-27 |
| 11965834 | Dark-field optical inspection device | — | 2024-04-23 |