Issued Patents 2024
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12066490 | Wrapper cell design and built-in self-test architecture for 3DIC test and diagnosis | Anshuman Chandra | 2024-08-20 |
| 12014130 | System and method for ESL modeling of machine learning | Kai-Yuan Ting, Tze-Chiang Huang, Yun-Han Lee | 2024-06-18 |
| 11899064 | Scan architecture for interconnect testing in 3D integrated circuits | Yun-Han Lee, Saman M. I. Adham, Marat Gershoig | 2024-02-13 |
| 11879933 | Method of testing an integrated circuit and testing system | Ankita Patidar, Yun-Han Lee | 2024-01-23 |