Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12033710 | System and method for conducting built-in self-test of memory macro | Ted Wong, Saman M. I. Adham | 2024-07-09 |
| 11899064 | Scan architecture for interconnect testing in 3D integrated circuits | Sandeep Kumar Goel, Yun-Han Lee, Saman M. I. Adham | 2024-02-13 |