Issued Patents 2024
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12087003 | Auto calibration from epipolar line distance in projection pattern | Patrick Schindler, Friedrich SCHICK, Christian LENNARTZ, Jakob UNGER | 2024-09-10 |
| 11989896 | Depth measurement through display | Patrick Schindler, Benjamin REIN, Christian Bonsignore, Michael Eberspach | 2024-05-21 |
| 11947013 | Detector for identifying at least one material property | Friedrich SCHICK, Patrick Schindler, Andre Schmidt, Michael Eberspach, Christian LENNARTZ +6 more | 2024-04-02 |
| 11922657 | Detector for determining a position of at least one object | Michael Eberspach, Patrick Schindler, Robert Send, Christian LENNARTZ, Ingmar Bruder | 2024-03-05 |
| 11908156 | Detector for determining a position of at least one object | Michael Eberspach, Christian LENNARTZ, Robert Send, Patrick Schindler, Ingmar Bruder | 2024-02-20 |
| 11875522 | Method and devices for determining a filling level in at least one storage unit | Christian Bonsignore, Christian Daniel SCHILDKNECHT, Patrick Schindler, Edgar Matevosjan, Christoph Lungenschmied +2 more | 2024-01-16 |
| 11860292 | Detector and methods for authenticating at least one object | Michael Eberspach, Thomas Ohmer, Robert Send, Christian LENNARTZ, Christopher HAHNE +9 more | 2024-01-02 |