Issued Patents 2024
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12087003 | Auto calibration from epipolar line distance in projection pattern | Patrick Schindler, Friedrich SCHICK, Peter Schillen, Jakob UNGER | 2024-09-10 |
| 11947013 | Detector for identifying at least one material property | Friedrich SCHICK, Peter Schillen, Patrick Schindler, Andre Schmidt, Michael Eberspach +6 more | 2024-04-02 |
| 11922657 | Detector for determining a position of at least one object | Michael Eberspach, Peter Schillen, Patrick Schindler, Robert Send, Ingmar Bruder | 2024-03-05 |
| 11906421 | Enhanced material detection by stereo beam profile analysis | Patrick Schindler, Ruben HUEHNERBEIN, Jakob UNGER | 2024-02-20 |
| 11908156 | Detector for determining a position of at least one object | Michael Eberspach, Robert Send, Patrick Schindler, Peter Schillen, Ingmar Bruder | 2024-02-20 |
| 11860292 | Detector and methods for authenticating at least one object | Michael Eberspach, Thomas Ohmer, Robert Send, Christopher HAHNE, Stefan Hengen +9 more | 2024-01-02 |