Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12146839 | Deep learning system applicable for quality inspection by learning only non-defective manufactured product data and control method thereof | Ha Il Jung, Jung Ywn Park, Jeong Hyun PARK | 2024-11-19 |
| 12125264 | Deep learning-based quality inspection system applicable to injection process and control method thereof | Jung Ywn Park, Ha Il Jung, Jeong Hyun PARK | 2024-10-22 |