Issued Patents 2024
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12146839 | Deep learning system applicable for quality inspection by learning only non-defective manufactured product data and control method thereof | Ha Il Jung, Jung Ywn Park, Qing Tang | 2024-11-19 |
| 12125264 | Deep learning-based quality inspection system applicable to injection process and control method thereof | Jung Ywn Park, Ha Il Jung, Qing Tang | 2024-10-22 |
| 12087421 | AI-based product surface inspecting apparatus and method | Jung Ywn Park, Ha Il Jung | 2024-09-10 |
| 12020478 | Thermal image-based hybrid object detection method using YOLO model and object tracking technique | Jung Ywn Park, Ha Il Jung | 2024-06-25 |
| 11914001 | Power control device and open-circuit fault diagnosis method thereof | Soon Myung Kwon, Jung Hyeon Bae, Hyo Geun Kwak, Sae Rom Kim, Young Hoo Yoon | 2024-02-27 |
| 11908825 | Semiconductor die stack having bent wires and vertical wires and a semiconductor package including the semiconductor die stack | — | 2024-02-20 |
| 11901345 | Semiconductor package | Bok Kyu CHOI | 2024-02-13 |