Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11971451 | Method for determining parameters in on-wafer calibration piece model | Aihua Wu, Yibang Wang, Faguo Liang, Chen Liu, Peng Luan +2 more | 2024-04-30 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11971451 | Method for determining parameters in on-wafer calibration piece model | Aihua Wu, Yibang Wang, Faguo Liang, Chen Liu, Peng Luan +2 more | 2024-04-30 |