Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12025501 | Three-dimensional displacement compensation method for microscopic thermoreflectance thermography and control device | Yan Liu, Wei Wang, Yuwei Zhai, Hao Li, Chen Ding +2 more | 2024-07-02 |
| 11971451 | Method for determining parameters in on-wafer calibration piece model | Yibang Wang, Faguo Liang, Chen Liu, Ye Huo, Peng Luan +2 more | 2024-04-30 |