Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12014987 | Electro-migration reduction | Yi-Chen Ho, Cheng-Yeh Yu, Hsin-Hsing Chen, Ju Ru Hsieh | 2024-06-18 |
| 11900586 | Hot spot defect detecting method and hot spot defect detecting system | Chien-Huei Chen, Pei-Chao Su, Xiaomeng Chen, Chan-Ming Chang, Shih-Yung Chen +6 more | 2024-02-13 |