Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11940391 | Defect inspection apparatus, method for inspecting defect, and method for manufacturing photomask blank | Ryusei Terashima, Tsuneo Terasawa | 2024-03-26 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11940391 | Defect inspection apparatus, method for inspecting defect, and method for manufacturing photomask blank | Ryusei Terashima, Tsuneo Terasawa | 2024-03-26 |