YI

Yukimitsu IWANAGA

SH Shimadzu: 1 patents #114 of 354Top 35%
Overall (2024): #202,326 of 561,600Top 40%
1
Patents 2024

Issued Patents 2024

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
12055382 Strain distribution measurement system and strain distribution measurement method that measure strain distribution based on distribution of reflectance or polarization characteristic Tomotaka Nagashima, Norio Hirayama 2024-08-06