Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12099000 | Defect detection device and defect detection method | Takahide HATAHORI, Kenji Takubo | 2024-09-24 |
| 12055382 | Strain distribution measurement system and strain distribution measurement method that measure strain distribution based on distribution of reflectance or polarization characteristic | Yukimitsu IWANAGA, Norio Hirayama | 2024-08-06 |