Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12118708 | Device and method for detecting defects on wafer | Do-Nyun Kim, Jaehoon Kim, Woojoo Sim | 2024-10-15 |
| 12062164 | Pattern analysis system and method of manufacturing semiconductor device using the same | Dong Hoon KUK | 2024-08-13 |