Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12118708 | Device and method for detecting defects on wafer | Min-Cheol Kang, Jaehoon Kim, Woojoo Sim | 2024-10-15 |
DK
Do-Nyun Kim
Seoul National University R&Db Foundation: 1 patents #64 of 463Top 15%
Overall (2024): #482,570 of 561,600Top 90%
1
Patents 2024