Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12142340 | Testing system and testing method | Shih-Chieh Lin, Li-Wei Deng | 2024-11-12 |
| 11935611 | Memory device, memory test circuit and memory test method thereof having repair information maintaining mechanism | Shih-Chieh Lin | 2024-03-19 |