Issued Patents 2024
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12171095 | Memory structure | Shuen-Hsiang Ke | 2024-12-17 |
| 12142340 | Testing system and testing method | Sheng-Lin Lin, Li-Wei Deng | 2024-11-12 |
| 11935611 | Memory device, memory test circuit and memory test method thereof having repair information maintaining mechanism | Sheng-Lin Lin | 2024-03-19 |