Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12130858 | Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions | Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel +2 more | 2024-10-29 |
| 11902665 | Automated application of drift correction to sample studied under electron microscope | Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel +5 more | 2024-02-13 |