Issued Patents 2024
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12130858 | Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions | Franklin Stampley Walden, II, David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks +2 more | 2024-10-29 |
| 12010430 | Automated application of drift correction to sample studied under electron microscope | Franklin Stampley Walden, II, David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks +1 more | 2024-06-11 |
| 11902665 | Automated application of drift correction to sample studied under electron microscope | Franklin Stampley Walden, II, David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks +5 more | 2024-02-13 |
| 11869744 | Electron microscope sample holder fluid handling with independent pressure and flow control | Franklin Stampley Walden, II, Daniel Stephen Gardiner, William Bradford Carpenter | 2024-01-09 |