Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12174017 | Composite measurement system for measuring nanometer displacement | Yushu Shi, Fang Wang, Lei Pi, Xiangpeng Bu | 2024-12-24 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12174017 | Composite measurement system for measuring nanometer displacement | Yushu Shi, Fang Wang, Lei Pi, Xiangpeng Bu | 2024-12-24 |