LP

Lei Pi

NC National Institute Of Metrology, China: 1 patents #1 of 36Top 3%
Overall (2024): #372,799 of 561,600Top 70%
1
Patents 2024

Issued Patents 2024

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
12174017 Composite measurement system for measuring nanometer displacement Yushu Shi, Shu Zhang, Fang Wang, Xiangpeng Bu 2024-12-24