JM

John Moffitt

NI Nanotronics Imaging: 1 patents #14 of 27Top 55%
📍 Krumme Reihe, CA: #1 of 2 inventorsTop 50%
🗺 California: #26,178 of 67,048 inventorsTop 40%
Overall (2024): #404,981 of 561,600Top 75%
1
Patents 2024

Issued Patents 2024

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11995802 System, method and apparatus for macroscopic inspection of reflective specimens Matthew C. Putman, John B. Putman, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola +1 more 2024-05-28