JA

Jeffrey Andresen

NI Nanotronics Imaging: 1 patents #14 of 27Top 55%
📍 Gilroy, CA: #33 of 71 inventorsTop 50%
🗺 California: #26,178 of 67,048 inventorsTop 40%
Overall (2024): #423,926 of 561,600Top 80%
1
Patents 2024

Issued Patents 2024

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11995802 System, method and apparatus for macroscopic inspection of reflective specimens Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Scott Pozzi-Loyola +1 more 2024-05-28