Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12100467 | Systems and methods for testing redundant fuse latches in a memory device | Yoshinori Fujiwara, Jason Johnson, Kevin G. Werhane, Daniel S. Miller | 2024-09-24 |
| 12100476 | Test mode security circuit | Kari Crane, Kevin G. Werhane, Yoshinori Fujiwara, Jason Johnson, Daniel S. Miller | 2024-09-24 |