PK

Pieter Kruit

FE Fei: 1 patents #22 of 111Top 20%
HH Hitachi High-Technologies: 1 patents #163 of 480Top 35%
📍 Delft, NL: #9 of 142 inventorsTop 7%
Overall (2024): #127,208 of 561,600Top 25%
2
Patents 2024

Issued Patents 2024

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
12062519 Beam deflection device, aberration corrector, monochromator, and charged particle beam device Hideto Dohi 2024-08-13
11961709 Charged particle beam device for inspection of a specimen with a plurality of charged particle beamlets Ali Mohammadi-Gheidari, Erik René Kieft 2024-04-16