EK

Erik René Kieft

FE Fei: 1 patents #22 of 111Top 20%
Overall (2024): #474,125 of 561,600Top 85%
1
Patents 2024

Issued Patents 2024

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11961709 Charged particle beam device for inspection of a specimen with a plurality of charged particle beamlets Ali Mohammadi-Gheidari, Pieter Kruit 2024-04-16