Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11921433 | Optical metrology in machine learning to characterize features | Yan Zhang, Osman Sorkhabi | 2024-03-05 |
| 11885750 | Integrated wafer bow measurements | Rajan Arora, Michael Souza, Wayne Tang, Yassine Kabouzi | 2024-01-30 |