Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12077813 | Methods and systems for sample analysis | Pranav Patel, Amir Sadri, Yann Jouvenot | 2024-09-03 |
| 11885750 | Integrated wafer bow measurements | Rajan Arora, Michael Souza, Wayne Tang, Ye Feng | 2024-01-30 |