Issued Patents 2024
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12062165 | Characterization system and method with guided defect discovery | Tommaso Torelli, Muthukrishnan Sankar, Vineethanand Hariharan | 2024-08-13 |
| 11922619 | Context-based defect inspection | Brian Duffy, Laurent Karsenti, Kuljit S. Virk, Asaf J. Elron, Ruslan Berdichevsky +7 more | 2024-03-05 |