AE

Asaf J. Elron

KL Kla: 1 patents #57 of 230Top 25%
📍 Ramat HaSharon, IL: #32 of 100 inventorsTop 35%
Overall (2024): #535,161 of 561,600Top 100%
1
Patents 2024

Issued Patents 2024

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11922619 Context-based defect inspection Brian Duffy, Bradley Ries, Laurent Karsenti, Kuljit S. Virk, Ruslan Berdichevsky +7 more 2024-03-05