Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12100574 | Target and algorithm to measure overlay by modeling back scattering electrons on overlapping structures | Nadav Gutman, Carey Phelps | 2024-09-24 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12100574 | Target and algorithm to measure overlay by modeling back scattering electrons on overlapping structures | Nadav Gutman, Carey Phelps | 2024-09-24 |