Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12038271 | Detecting outliers and anomalies for OCD metrology machine learning | EITAN ROTHSTEIN, Yongha Kim, Ilya Rubinovich, ARIEL BROITMAN, Barak Bringoltz | 2024-07-16 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12038271 | Detecting outliers and anomalies for OCD metrology machine learning | EITAN ROTHSTEIN, Yongha Kim, Ilya Rubinovich, ARIEL BROITMAN, Barak Bringoltz | 2024-07-16 |