Issued Patents 2024
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12165341 | Optical resolution measurement method for optical devices | Yangyang SUN, Ludovic Godet | 2024-12-10 |
| 12159392 | Die system and method of comparing alignment vectors | Yongan Xu, Chan Juan XING, Yifei Wang, Ludovic Godet | 2024-12-03 |
| 12153344 | Lithography method to form structures with slanted angle | Yongan Xu, Jhenghan YANG, Ludovic Godet | 2024-11-26 |
| 12140494 | Method to measure light loss of optical films and optical substrates | Kang Luo, Fariah Hayee, Ludovic Godet | 2024-11-12 |
| 12085475 | Method to determine line angle and rotation of multiple patterning | Yongan Xu, Chan Juan XING, Ludovic Godet | 2024-09-10 |
| 12050327 | Imaging system and method of manufacturing a metalens array | Tapashree Roy, Ludovic Godet, Wayne MCMILLAN, Robert Jan Visser | 2024-07-30 |
| 12021102 | Imaging system and method of creating composite images | Yongan Xu, Ludovic Godet, Naamah ARGAMAN, Robert Jan Visser | 2024-06-25 |
| 12019242 | Full-field metrology tool for waveguide combiners and meta-surfaces | Yangyang SUN, Ludovic Godet | 2024-06-25 |
| 12003841 | Edge inspection system for inspection of optical devices | Michael David-Scott Kemp | 2024-06-04 |
| 11988574 | Illumination system for AR metrology tool | Yangyang SUN, Kazuya Daito, Ludovic Godet | 2024-05-21 |
| 11978196 | See-through metrology systems, apparatus, and methods for optical devices | Yangyang SUN, Kazuya Daito, Ludovic Godet | 2024-05-07 |
| 11913776 | Interference in-sensitive Littrow system for optical device structure measurement | Yangyang SUN, Ludovic Godet | 2024-02-27 |
| 11892367 | Method to measure light loss of optical films and optical substrates | Kang Luo, Fariah Hayee, Ludovic Godet | 2024-02-06 |
| 11873554 | Ion implantation to modify glass locally for optical devices | Nai-Wen Pi, Kang Luo, Ludovic Godet | 2024-01-16 |