Issued Patents 2024
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12094146 | Contour analysis apparatus, processing condition determination system, shape estimation system, semiconductor device manufacturing system, search apparatus, and data structure used in them | Takeshi Ohmori, Naoto Takano | 2024-09-17 |
| 12036609 | Additive manufacturing condition search apparatus, additive manufacturing condition search method, and reference sample | Hirotsugu Kawanaka, Noboru Saitou, Shinji Matsushita | 2024-07-16 |
| 11907235 | Plasma processing apparatus including predictive control | Yutaka Okuyama, Takeshi Ohmori, Masaru Kurihara | 2024-02-20 |