YM

Yohei Minekawa

HH Hitachi High-Technologies: 1 patents #163 of 480Top 35%
Overall (2024): #206,152 of 561,600Top 40%
1
Patents 2024

Issued Patents 2024

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
12154264 Defect inspecting system and defect inspecting method Minoru Harada, Naoaki KONDO 2024-11-26