Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12154264 | Defect inspecting system and defect inspecting method | Naoaki KONDO, Yohei Minekawa | 2024-11-26 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12154264 | Defect inspecting system and defect inspecting method | Naoaki KONDO, Yohei Minekawa | 2024-11-26 |