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Tomá{hacek over (s)} Tůma

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1
Patents 2024

Issued Patents 2024

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11971372 Method of examining a sample using a charged particle microscope Jan Klusá{hacek over (c)}ek, Ji{hacek over (r)}í Pet{hacek over (r)}ek 2024-04-30