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Jan Klusá{hacek over (c)}ek

FE Fei: 1 patents #22 of 111Top 20%
📍 Brno, CZ: #23 of 113 inventorsTop 25%
Overall (2024): #428,777 of 561,600Top 80%
1
Patents 2024

Issued Patents 2024

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11971372 Method of examining a sample using a charged particle microscope Tomá{hacek over (s)} Tůma, Ji{hacek over (r)}í Pet{hacek over (r)}ek 2024-04-30